A/D converters
Digital signal processing, as its name states, assumes that the
signals to be processed are digital, i.e., they can be represented by a series
of numbers. Nevertheless, the signals of the real world are continuous both in
time and value. The conversion between the two representations is made by the
analog-digital (A/D) converter, by which the incoming signal becomes sampled
(i.e., discretized in time) and quantized (rounded, i.e., discretized in
amplitude). The task of a D/A, digital-analog converter is to restore the analog
signal from the series of numbers by interpolation.
The ability and efficiency of signal processing considerably
depend on the properties of such converters. Improving the quality of the
conversion on the digital side is a very hard task. Accordingly, important
research area is (i) to search for higher quality A/D converter structures and
(ii) to qualify the manufactured converters.
In our laboratory, research on delta-sigma (ΔΣ) or sigma-delta converters started in 2001. As a
result of a fruitful foreign co-operation, internationally reknown results have
been achieved. The practical outcome of the research is a commercial 22-bit A/D
converter chip, which can be used primaliry in DC-measuring applications.
Research on A/D converter
testing is lead by our college, Prof.
István Kollár. Some of us are also involved in the research and development
of the project, and most measurements and data acquisition required for testing
are also carried out here. This project is also respected by the international
professional community. Similarly to the previous project, the results achieved
in this field are two-fold. On the one hand, theoretical derivations have been
published on the achivable precision on the estimated parameters of a sine-wave
fitted on quantized samples, on the other hand a software tool has been
developed which implements most of the testing methods defined in the standard
IEEE-STD-1241.
In the following, these research areas and results are discussed in
details.
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Higher-order
Incremental Delta-Sigma Analog-to-Digital Converters
Analysis of the transient operation of higher-order delta-sigma A/D
converters for DC-measurement applications. Improving the performace of
the first-order converter by means of dithering. Extending the operation
of the first-order incremental converter to higher-order modulator
structures. |
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Dynamic Testing
of A/D Converters Using Sinusoid Signals
Analysis of the dynamic behavior of converters in the time-domain.
Algorithms for three- and four-parameter sine-wave fit, derivation of the
theoretical and practical limits of such algorithms. Equivalence of the
parametric fitting and the Discrete Fourier Transformation in the special
case of coherent sampling. |
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