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.	Dept. of Measurement and Information Systems, Budapest University of Technology and Economics Digital Signal Processing Laboratory

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Publications Related to A/D Converters

Books, book chapters

Vilmos P�lfi, Bal�zs Renczes, "Methods for Processing Measured Sinusoidal Signals and their Application in Analogue-to-Digital Converter Classification", in: P�celi, G�bor (eds.) Measurement and Data Science, Newcastle upon Tyne, United Kingdom / England, Cambridge Scholars Publishing (2021) 375 p. pp. 279-355. , 77 p.
Vilmos P�lfi, Bal�zs Renczes, Tam�s Virosztek, "M�dszerek m�rt szinuszjel feldolgoz�s�ra �s anal�g-digit�lis �talak�t�k jellemz�s�hez t�rt�no felhaszn�l�s�ra", In: P�celi, G�bor (eds.) M�r�s- �s adattudom�ny: V�logatott fejezetek, (in Hungarian), Budapest, Hungary, Akad�miai Kiad�, (2020)

Journal Papers

Vilmos P�lfi, "An Improved Sine Wave Histogram Test Method for ADC Characterization," in IEEE Transactions on Instrumentation and Measurement, vol. 68, no. 10, pp. 3446-3455, Oct. 2019.
T. Virosztek, Istv�n Koll�r, "Parameterization of nonideal quantizers for simultaneous estimation of quantizer and excitation signal parameters", (at the publisher)MEASUREMENT, vol. 111, pp. 412-419. 2017.
Tam�s Virosztek, "Maximum Likelihood Estimation of Aperture Jitter Using Sinusoidal Excitation", (at the publisher) MEASUREMENT 115: pp. 95-103. 2017.
Tam�s Virosztek and Istv�n Koll�r, "Theoretical Limits of Parameter Estimation Based on Quantized Data", Periodica Polytechnica-Electrical Engineering and Computer Science 61:(4) Paper 10224. 8 p. 2017.
Bal�zs Renczes, "Accurate Floating-Point Argument Calculation for Sine-Fitting Algorithms", IEEE Trans. on Instrum. Meas, Vol. 66, No. 11, pp. 2988 - 2996, 2017.
Bal�zs Renczes, Istv�n Koll�r, Antonio Moschitta, Paolo Carbone, "Numerical Optimization Problems of Sine Wave Fitting Algorithms in the Presence of Roundoff Errors", IEEE Trans. on Instrum. Meas, Vol. 65, No. 8, pp. 1785 - 1795, 2016.
Bal�zs Renczes, Istv�n Koll�r, Tam�s Dab�czi, "Efficient Implementation of Least Squares Sine Fitting Algorithms", IEEE Trans. on Instrum. Meas., vol. 65., No. 12, Dec. 2016.
Vilmos P�lfi, Tam�s Virosztek, Istv�n Koll�r, "Full information ADC test procedures using sinusoidal excitation, implemented in MATLAB and LabVIEW", ACTA IMEKO 4:(3) pp. 4-13., 2015.
Bal�zs Renczes and Istv�n Koll�r, "Compensation of Analog-to-Digital Converter Nonlinearities using Dither," Periodica Polytechnica � Electrical Engineering 57, 2013.
J�n �aliga, Linus Michaeli, J�n Bu�a, Jozef Lipt�k, Istv�n Koll�r, Tam�s Virosztek, "A Comparison of Least Squares and Maximum Likelihood Based Sine Fittings in ADC Testing", MEASUREMENT 46: pp. 4362-4368. 2013.
Vilmos P�lfi and Istv�n Koll�r, "Acceleration of ADC test with sine wave fit", IEEE Transactions on instrumentation and measurement 62:(5) pp. 880-888. Paper 2243500. 2013.
L�szl� Balogh, Istv�n Koll�r, Linus Michaeli, J�n Saliga, Jozef Lipt�k, "Full Information from Measured ADC Test Data using Maximum Likelihood Estimation," Measurement Journal, vol. 45, no. 2, pp. 164-169, 2012.
V. Quiquempoix, P. Deval, A. Barreto, G. Bellini, J. M�rkus, J. Silva, and G. C. Temes, "A low-power 22-bit incremental ADC," IEEE Journal of Solid-State Circuits, vol. 41, no. 7, July 2006, pp. 1562-71.
J. M�rkus and I. Koll�r, "On the monotonicity and linearity of ideal radix-based A/D converters," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 6, pp. 2545-2457, Dec. 2005.
J. M�rkus, J. Silva, and G. C. Temes, "Theory and applications of incremental delta-sigma converters," IEEE Transactions on Circuits and Systems-I: Regular Papers, vol. 51, no. 4, pp. 678-690, Apr. 2004.
J. M�rkus and G. C. Temes, "An efficient delta-sigma ADC architecture for low oversampling ratios," IEEE Transactions on Circuits and Systems I. - Special Issue on Advances on Analog-to-Digital and Digital-to-Analog Converters, vol. 51, no. 1, pp. 63-71, Jan. 2004.
T. Z. Bilau, T. Megyeri, A. S�rhegyi, J. M�rkus, and I. Koll�r, "Four-parameter fitting of sine wave testing results: Iteration and convergence," Computer Standards and Interfaces, vol. 26, no. 1, pp. 51-56, Jan. 2004.
J. M�rkus and I. Koll�r, "Standard environment for the sine wave test of ADC's," Special Issue on ADC Modeling and Testing of the Measurement Journal, vol. 31, no. 4, pp. 261-69, June 2002.

Conference Papers

Bal�zs Renczes, Vilmos P�lfi, "Improving the Conditioning of Maximum Likelihood Sine Wave Fitting", 22nd IMEKO TC4 International Symposium & 20th International Workshop on ADC Modelling and Testing, Iasi, Romania, Sept. 2017
Tam�s Virosztek and Istv�n Koll�r "Parameterization of Nonlinearity for Efficient Estimation in ADC Testing", 21st IMEKO TC-4 Symposium and 19th International Workshop on ADC Modelling and Testing, Budapest, Hungary, Sept. 2016.
Bal�zs Renczes, Istv�n Koll�r, Paolo Carbone, Antonio Moschitta, Vilmos P�lfi, Tam�s Virosztek, "Analyzing Numerical Optimization Problems of Finite Resolution Sine Wave Fitting Algorithms," Proceedings of the IEEE Instrumentation and Measurement Technology Conference (I2MTC 2015), pp. 1662-1667, Pisa, Italy, May 2015.
Vilmos P�lfi, Tam�s Virosztek and Istv�n Koll�r, "ADC Test Tool for LabVIEW," Proceedings of the 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing, Benevento, Italy, Sept. 2014.
Vilmos P�lfi and Istv�n Koll�r, "Reliable ADC testing using LabVIEW," Proceedings of the 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing, Benevento, Italy, Sept. 2014.
Tam�s Virosztek and Istv�n Koll�r, "ADC Testing in Standard and Non-standard Ways, Executed in a Unified Framework", Proc. 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing, Paper 232, Benevento, Italy, Sept. 2014.
Bal�zs Renczes, Istv�n Koll�r, "Roundoff Errors in the Evaluation of the Cost Function in Sine Wave Based ADC Testing", Proc. 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing, pp. 248-252, Benevento, Italy, Sept. 2014.
Vilmos P�lfi and Istv�n Koll�r, "Improving the result of the histogram test using a fast sine fit algorithm", 19th IMEKO TC 4 Symposium and 17th IWADC Workshop: Advances in Instrumentation and Sensors Interoperability. Paper 118, Barcelona, Spain, July 2013.
Bal�zs Renczes and Istv�n Koll�r, "Linearization of A/D converters using interpolation of samples," 19th IMEKO TC 4 Symposium and 17th IWADC Workshop: Advances in Instrumentation and Sensors Interoperability, Paper 124, Barcelona, Spain, July 2013.
J�n �aliga, Linus Michaeli, J�n Bu�a, Jozef Lipt�k, Istv�n Koll�r, and Tam�s Virosztek, "Experimental comparison of Maximum Likelihood and LS Fitting for ADC Testing" Proc. XX IMEKO World Congress: Metrology for Green Growth. Paper 517, Busan, South-Korea, Sept. 2012.
Tam�s Virosztek ad Istv�n Koll�r, "User-Friendly Matlab Tool for Easy ADC Testing," Proc. 19th IMEKO TC 4 Symposium and 17th IWADC Workshop: Advances in Instrumentation and Sensors Interoperability, Paper 133, Barcelona, Spain, 18-19. July, 2013.
L. Balogh, I. Koll�r, L. Michaeli, J. Saliga, J. Lipt�k, "Extracting Full Information from Measured ADC Data,"

in Proceedings of the 15th International Workshop on ADC Modelling and Testing (IMEKO), Kassa, Slovakia, Sep. 2010.
L. Balogh, I. Koll�r, A. S�rhegyi, "Maximum Likelihood Estimation of ADC Parameters," in Proceedings of the IEEE Instrumentation and Measurement Technology Conference (IMTC'2010) Austin, USA, May 2010. pp. 24-29.
J. M�rkus, J. Silva, and G. C. Temes, "Delta-sigma architectures for dc measurement - an overview," in CICC'2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, San Jose, CA, USA, 10-13 Sept. 2006.
V. Quiquempoix, P. Deval, A. Barreto, G. Bellini, J. Collings, J. M�rkus, J. Silva, and G. C. Temes, "A low-power 22-bit incremental adc with 4 ppm inl, 2 ppm gain error and 2 uv dc offset," in ESSCIRC'2005, Proceedings of the 31st European Solid-State Circuits Conference, Grenoble, France, 12-16 Sept. 2005, pp. 446-446.
J. M�rkus and I. Koll�r, "On the monotonicity and linearity of ideal radix-based A/D converters," in Proceedings of the IEEE Instrumentation and Measurement Technology Conference (IMTC'2004), vol. 1, Como, Italy, 18-20 May 2004, pp. 696-701.
J. M�rkus, J. Silva, and G. C. Temes, "Design theory of high-order incremental converters," in Proceedings of the IEEE International Symposium on Intelligent Signal Processing (WISP'2003), Budapest, Hungary, 4-6 Sept. 2003, pp. 3-8.
J. M�rkus and G. C. Temes, "An efficient delta-sigma noise-shaping architecture for wideband applications," in Proceedings of the 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications; 7th European Workshop on ADC Modelling and Testing (ADDA-EWADC 2002), Prague, Czech Republic, 26-28 June 2002, pp. 35-38.
T. Z. Bilau, T. Megyeri, A. S�rhegyi, J. M�rkus, and I. Koll�r, "Four-parameter fitting of sine wave testing results - iteration and convergence," in Proceedings of the 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications; 7th European Workshop on ADC Modelling and Testing (ADDA-EWADC 2002), Prague, Czech Republic, 26-28 June 2002, pp. 185-190.
J. M�rkus and I. Koll�r, "Standard framework for IEEE-STD-1241 in MATLAB," in Proceedings of the IEEE Instrumentation and Measurement Technology Conference (IMTC'2001), vol. 3, Budapest Convention Centre, Budapest, Hungary, 21-23 May 2001, pp. 1847-52.
I. Koll�r and J. M�rkus, "Sine wave test of ADC's: Means for international comparison," in Proceedings of the IMEKO TC4 5th European Workshop on ADC Modelling and Testing (EWADC), P. Daponte, L. Michaeli, M. N. Durakbasa, and A. Afjehi-Sadat, Eds., Vienna, Austria, 25-28 Sept. 2000, pp. 211-16.

Other

T. Virosztek, Maximum likelihood estimation of ADC parameters, Master's thesis, Budapest University of Technology and Economics, Department of Measurement and Information Systems, Budapest, Hungary, 2013.
J. M�rkus, "Higher-order incremental delta-sigma analog-to-digital converters," Ph.D. dissertation, Budapest University of Technology and Economics, Department of Measurement and Information Systems, Magyar tud�sok k�r�tja 2. H-1117 Budapest, Hungary, Mar. 2005, 132 p.
G. C. Temes, J. Silva, and J. M�rkus, Switched Capacitor Signal Scaling Circuit, Assignee: Microchip Technology Inc., Mar. 2004, US patent application, filed on March 23, 2004.
J. M�rkus and I. Koll�r, ADC Test Data Evaluation Program for Matlab, Budapest University of Technology and Economics, Department of Measurement and Information Systems, 2002.